光學材料的表征

《光學材料的表征》是A.材料科學與工程類教學研究學習用書，哈爾濱工業大學出版社2014年出版。屬於材料表征原版系列叢書中的一種。

基本介紹

• 書名：光學材料的表征
• 作者：[美]布倫德爾（Brundle C.R.），[美]埃文斯（Evans C.A.），[美]伊莎霍斯（Exarhos G.J.）
• ISBN：9787560342795
• 頁數：211
• 定價：78.00
• 出版社：哈爾濱工業大學出版社
• 出版時間：2014-1-1
• 裝幀：平裝
• 開本：16開

內容簡介

相關領域的教學、研究、技術人員以及研究生和高年級本科生參考書。

圖書目錄

Preface to the Reissue ofthe Materials Characterization Series

Preface to Series

Preface to the Reissue of Characterization of Optical Materials

Preface

Contributors

INTRODUCTION

PART 1 INFLUENCE OF SURFACEMORPHOLOGYAND

MICROSTRUCTURE ON OPTICAL RESPONSE

CHARACTERIZATION OF SURFACE ROUGHNESS

1.1 Introduction

1.2 WhatSurfaceRoughnessls

1.3 HowSurfaceRoughness AffctsOpticaIMeasurements

1.4 How Surface Roughness and ScatteringAre Measured

1.5 Characterization ofSelected Surfaces

1.6 Future Difections

CHARACTERIZATION OF THE NEAR-SURFACE REGION USING POIARIZATION-SENSITIVE OPTICAL TECHNIQUES

2.1 Introduction

2.2 Ellipsometry

ExperimentallmplementationsofEllipsometry 29, Analysisof

EllipsometryData

2.3 MicrostructuralDeterminationsfromEllipsometryData

Temperature Dependence ofthe Opticat Properties ofSilicon 34,

Determination ofthe Optical Functions ofGlasses Using SE 35,

SpectroscopicEllipsometryStudiesofSi02/Si 37, Spectroscopic

EllipsometryforComplicatedFilmStrucrures 38, Time-Resolved

Ellipsometry 40, Single-WavelengthReal-TimeMonitoringofFilm

Growth 41, Multiple-WavelengthReal-TimeMonitoringofFilm

Growth 42, Infrared EllipsometryStudies ofFilm Growth

THE COMPOSITION, STOICHIOMETRY, AND RELATED MICROSTRUCTURE OF OPTICAL MATERIALS

3.1 Introduction

3.2 AspectsofRamanScattering

3.3 III-VSemiconductor Systems

3.4 GroupIVMaterials

3.5 Amorphous and Microcrystalline Semiconductors

ChalcogenideGlasses 60, GroupIVMicrocrystallineSemiconductors

3.6 Summary

DIAMOND AS AN OPTICAL MATERIAL

4.1 Introduction

4.2 DepositionMethods

4.3 0pticalPropertiesofCVD Diamond

4.4 Defectsin CVD Diamond

4.5 PolishingCVD Diamond

4.6 X-rayWindow

4.7 Summary

PART 2 STABILITY AND MODIFICATION OF FILM AND SURFACE OPTICAL PROPERTIES

MULTIJAYER OPTICAL COATINGS

5.1 Introduction

5.2 Single-LayerOpticalCoatings

OpticaIConstants 90, CompositionMeasurementTechniques

5.3 MultilayerOpticalCoatings

CompositionaIAnalysis 107, SurfaceAnalyticaITechniques 108,

MicrostructuralAnalysis ofMultilayer Optical Coatings

5.4 StabilityofMultilayerOpticalCoatings

5.5 Future Compositional and

MicrostructuralAnalyticaITechniques

CHARACTERIZATION AND CONTROL OF STRESS IN OPTICAL FILMS

6.1 Introduction

6.2 0rigins ofStress