《Scanning Probe Microscopy》是一本圖書，作者是Meyer, Ernst; Hug, Hans Josef; Bennewitz, Roland。
基本介紹
- 外文名：Scanning Probe Microscopy
- 作者：Meyer, Ernst、Hug, Hans Josef、Bennewitz, Roland
- 出版時間：2004年
- 出版社：Springer
- 頁數：210 頁
- ISBN：9783540431800
- 定價：0.84 美元
內容簡介
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
簡譯：這本教科書由該領域的三位頂尖專家撰寫，描述並解釋了掃描探針顯微鏡的各個方面。重點是實驗設計和最佳化各種方法性能所需的程式。掃描探針顯微鏡不僅涵蓋了掃描探針顯微鏡背後的物理原理，還涵蓋了儀器設計、不同成像模式的基本特徵和反覆出現的偽影等問題。其目的是為涉及掃描探針顯微鏡的所有類型的課程提供一本通用教科書。三年級及以上的本科生應該能夠將其用於自學或作為探針顯微鏡課程的教材。此外，它在任何掃描探針顯微鏡實驗室都將是有價值的參考書。還介紹了新的套用和最新的重要結果，本書最後展望了掃描探針顯微鏡的未來前景，並討論了納米科學中的相關技術。這本書非常適合作為研究生的入門讀物，也將成為實踐研究人員開發和使用掃描探針技術的寶貴參考。
