《VLSI的統計分析和最佳化:時序和功耗(影印版)》介紹了積體電路的統計CAD工具的相關知識。主要面向CAD工具開發人員、積體電路工藝技術人員，以及相關學科的學生和研究人員。書中介紹了統計時序和功耗分析技術中的最新研究成果，並結合參數化的產量作為設計過程中的主要目標函式。該書強調算法、過程變數的建模方法，以及統計方法。
基本介紹
- 書名：VLSI的統計分析和最佳化:時序和功耗
- 出版社：科學出版社
- 頁數：279頁
- ISBN：9787030188502
- 作者：安歇斯 等
- 出版日期：2007年8月1日
- 語種：英語
- 品牌：科學出版社
基本介紹,內容簡介,作者簡介,圖書目錄,
基本介紹
內容簡介
《VLSI的統計分析和最佳化:時序和功汗促耗(影印只糠厚付版)》既可作為剛涉足CAD工具開發領域的人員的入門書籍，也可作為該凝閥嬸領域工程師的參考手冊。
作者簡介
作者：(美國)安歇斯 等
圖書目錄
Preface
Introduction
射犁遙 1.1 Sources of Variations
1.1.1 Process Variations
1.1.2 Environmental Variations
1.1.3 Modeling Variations
1.1.4 Other Sources of Variations
1.2 Components of Variation
1.2.1 Inter-die Variations
1.2.2 Intra-die Variations
1.3 Impact on Performance
Statistical Models and Techniques.
囑譽廈 2.1 Monte Carlo Techniques
2.1.1 Sampling Probability Distributions
2.2 Process Variation Modeling
2.2.1 Pelgrom's Model
2.2.2 Principal Components Based Modeling
2.2.3 Quad-Tree Based Modeling
2.2.4 Specialized Modeling Techniques
2.3 Performance Modeling
2.3.1 Response Surface Methodology
2.3.2 Non-Normal Performance Modeling
2.3.3 Delay Modeling
2.3.4 Interconnect Delay Models
2.3.5 Reduced-Order Modeling Techniques
Statistical Timing Analysis
酷諒良鞏 3.1 Introduction
3.2 Block-Based Timing Analysis
3.2.1 Discretized Delay PDFs
3.2.2 Reconvergent Fanouts
3.2.3 Canonical Delay PDFs
3.2.4 Multiple Input Switching
3.3 Path-Based Timing Analysis
3.4 Parameter-Space Techniques
3.4.1 Parallelepiped Method
3.4.2 Ellipsoid Method
3.4.3 Case-File Based Models for Statistical Timing
3.5 Bayesian Networks
4 Statistical Power Analysis
4.1 Overview
4.2 Leakage Models
4.3 High-Level Statistical Analysis
4.4 Gate-Level Statistical Analysis
4.4.1 Dynamic Power
4.4.2 Leakage Power
4.4.3 Temperature and Power Supply Variations
Yield Analysis
5.1 High-Level Yield Estimation
5.1.1 Leakage Analysis
5.1.2 Frequency Binning
腳精墊 5.1.3 Yield Computation
5.2 Gate-Level Yield Estimation
5.2.1 Timing Analysis
5.2.2 Leakage Power Analysis
5.2.3 Yield Estimation
5.3 Supply Voltage Sensitivity
Statistical Optimization Techniques
6.1 Optimization of Process Parameters
6.1.1 Timing Constraint
6.1.2 Objective Function
6.1.3 Yield Allocation
6.2 Gate Sizing
6.2.1 Nonlinear Programming
6.2.2 Lagrangian Relaxation
6.2.3 Utility Theory
6.2.4 Robust Optimization
6.2.5 Sensitivity-Based Optimization
6.3 Buffer Insertion
6.3.1 Deterministic Approach
6.3.2 Statistical Approach
6.4 Threshold Voltage Assignment
6.4.1 Sensitivity-Based Optimization
6.4.2 Dynamic Programming
References
Index
Introduction
射犁遙 1.1 Sources of Variations
1.1.1 Process Variations
1.1.2 Environmental Variations
1.1.3 Modeling Variations
1.1.4 Other Sources of Variations
1.2 Components of Variation
1.2.1 Inter-die Variations
1.2.2 Intra-die Variations
1.3 Impact on Performance
Statistical Models and Techniques.
囑譽廈 2.1 Monte Carlo Techniques
2.1.1 Sampling Probability Distributions
2.2 Process Variation Modeling
2.2.1 Pelgrom's Model
2.2.2 Principal Components Based Modeling
2.2.3 Quad-Tree Based Modeling
2.2.4 Specialized Modeling Techniques
2.3 Performance Modeling
2.3.1 Response Surface Methodology
2.3.2 Non-Normal Performance Modeling
2.3.3 Delay Modeling
2.3.4 Interconnect Delay Models
2.3.5 Reduced-Order Modeling Techniques
Statistical Timing Analysis
酷諒良鞏 3.1 Introduction
3.2 Block-Based Timing Analysis
3.2.1 Discretized Delay PDFs
3.2.2 Reconvergent Fanouts
3.2.3 Canonical Delay PDFs
3.2.4 Multiple Input Switching
3.3 Path-Based Timing Analysis
3.4 Parameter-Space Techniques
3.4.1 Parallelepiped Method
3.4.2 Ellipsoid Method
3.4.3 Case-File Based Models for Statistical Timing
3.5 Bayesian Networks
4 Statistical Power Analysis
4.1 Overview
4.2 Leakage Models
4.3 High-Level Statistical Analysis
4.4 Gate-Level Statistical Analysis
4.4.1 Dynamic Power
4.4.2 Leakage Power
4.4.3 Temperature and Power Supply Variations
Yield Analysis
5.1 High-Level Yield Estimation
5.1.1 Leakage Analysis
5.1.2 Frequency Binning
腳精墊 5.1.3 Yield Computation
5.2 Gate-Level Yield Estimation
5.2.1 Timing Analysis
5.2.2 Leakage Power Analysis
5.2.3 Yield Estimation
5.3 Supply Voltage Sensitivity
Statistical Optimization Techniques
6.1 Optimization of Process Parameters
6.1.1 Timing Constraint
6.1.2 Objective Function
6.1.3 Yield Allocation
6.2 Gate Sizing
6.2.1 Nonlinear Programming
6.2.2 Lagrangian Relaxation
6.2.3 Utility Theory
6.2.4 Robust Optimization
6.2.5 Sensitivity-Based Optimization
6.3 Buffer Insertion
6.3.1 Deterministic Approach
6.3.2 Statistical Approach
6.4 Threshold Voltage Assignment
6.4.1 Sensitivity-Based Optimization
6.4.2 Dynamic Programming
References
Index
