基本介紹
- 書名：納米技術中的顯微學手冊 Ⅱ
- 作者：王中林
- ISBN：9787302097587
- 定價：80元
- 出版社：清華大學出版社
- 出版時間：2005.08.01
- 裝幀：圓脊精裝
內容簡介,圖書目錄,
內容簡介
現代顯微學在納米技術領域的研究和發展中起到“眼睛”和“手”的功能。迄今，人們仍在孜孜不倦地尋找納米尺度上的“火眼金睛”。本手冊的目的在於提供關於各種顯微學的原理及其在該迅猛發展的領域內套用的綜述參考書。本手冊共有22個專題，每一專題都由不同研究領域的、處於世界前沿的科學家撰寫。本書是第2卷，敘述的是電子顯微學的內容，共有12個專題。本書力圖使讀者對所敘述的方法有一個概念上的理解，而不是只停留在對理論的堆砌上。在每一個專題里，都會敘述相關的實例及其套用並加以討論，使讀者對電子顯微技術能明了和理解；還會進一步展示各章之間的內在聯繫，表明每一種技術如何在綜合性的、複雜的測試中各自扮演獨特的角色，解決具體的問題。
圖書目錄
1High\|ResolutionScanningElectronMicroscopy1
1.1Introduction:ScanningElectronMicroscopy
andNanotechnology1
1.2Electron\|SpecimenInteractions5
1.2.1Electron\|SpecimenInteractionsin
HomogeneousMaterials6
1.2.2Electron\|SpecimentInteractionsin
CompositeSamples8
1.3Instrumentationof/theScanningElectronMicroscope10
1.3.1GeneralDescription10
1.3.2PerformanceofaScanningElectronMicroscope13
1.4TheResolutionofSecondary
andBackscatteredElectronImages18
1.5ContrastMechanismsofSEandBEImagesofNanoparticles
andOtherSystems21
1.5.1SmallParticleContrastinHigh\|Resolution
BEImages22
1.5.2SmallParticleContrastinHigh\|Resolution
SEImages25
1.5.3OtherContrastMechanisms28
1.6ApplicationstoCharacterizingNanophaseMaterials29
1.7SummaryandPerspectives32
References35
2HighSpatialResolutionQuantitativeElectronBeam
MicroanalysisforNanoscaleMaterials37
2.1Introduction37
2.2TheNanomaterialsCharacterizationChallenge:BulkNanostructures
andDiscreteNanoparticles37
2.2.1BulkNanostructures38
2.2.2Nanoparticles40
2.3PhysicalBasisoftheElectron\|Excited
AnalyticalSpectrometries40
2.4NanoscaleElementalCharacterizationwithHigh
ElectronBeamEnergy42
2.4.1EELS42
2.4.2X\|raySpectrometry48
2.5NanoscaleElementalCharacterizationwithLowand
IntermediateElectronBeamEnergy55
2.5.1IntermediateBeamEnergyX\|rayMicroanalysis56
2.5.2LowBeamEnergyX\|rayMicroanalysis:
BulkNanostructures59
2.5.3AugerSpectrometry62
2.5.4ElementalMapping65
2.6ExamplesofApplicationstoNanoscaleMaterials65
2.6.1AnalyticalElectronMicroscopy65
2.6.2LowVoltageSEM69
2.6.3Auger/X\|raySEM73
2.7Conclusions73
References74
3CharacterizationofNano\|CrystallineMaterialsUsingElectron
BackscatterDiffractionintheScanningElectronMicroscope77
3.1Introduction77
3.2HistoricalDevelopmentofEBSD78
3.3OriginofEBSDPatterns79
3.3.1CollectionofEBSDPatterns80
3.3.2AutomatedOrientationMapping83
3.4ResolutionofEBSD84
3.4.1LateralResolution84
3.4.2DepthResolution88
3.5SamplePreparationofNano\|MaterialsforEBSD88
3.6ApplicationsofEBSDtoNano\|Materials89
3.6.1HeteroepitaxyofBoronArsenideon\[0001\]6H\|Sic89
3.6.2ElectrodepositedNiforMEMSApplications91
3.6.3PolycrystallineSiForMEMSApplications93
3.7Summary95
References95
4HighResolutionTransmissionElectronMicroscopy97
4.1HRTEMandNanotechnology97
4.2PrinciplesandPracticeofHRTEM97
4.2.1BasisofImageFormation97
4.2.2DefinitionsofResolution99
4.2.3LatticeImagingorAtomicImaging101
4.2.4InstrumentalParameters102
4.2.5FurtherRequirements103
4.2.6Milestones104
4.3ApplicationsofHRTEM105
4.3.1Semiconductors105
4.3.2Metals107
4.3.3OxidesandCeramics110
4.3.4Surfaces112
4.3.5DynamicEvents113
4.4CurrentTrends114
4.4.1ImageViewingandRecording114
4.4.2On\|LineMicroscopeControl115
4.4.3DetectionandCorrectionofThird\|Order
Aberrations116
4.4.4QuantitativeHRTEM117
4.4.5Aberration\|CorrectedHRTEM118
4.5OngoingProblems119
4.5.1TheStobbs’Factor119
4.5.2RadiationDamage120
4.5.3InversionofCrystalScattering120
4.6SummaryandFuturePerspective121
References121
5ScanningTransmissionElectronMicroscopy127
5.1Introduction127
5.2STEMImaging131
5.3STEMImagingofCrystals138
5.3.1VeryThinCrystals138
5.3.2DynamicalDiffractionEffects140
5.3.3Channeling141
5.4DiffractioninSTEMInstruments142
5.4.1ScanningModeElectronDiffraction142
5.4.2Two\|DimensionalRecordingSystems142
5.4.3Convergent\|BeamElectronDiffraction143
5.4.4CoherentNanodiffraction145
5.5MicroanalysisinSTEM146
5.5.1ElectronEnergyLossSpectroscopyandImaging146
5.5.2SecondaryEmissions146
5.6StudiesofNanoparticlesandNanotubes147
5.6.1Nanoparticles147
5.6.2NanotubesandNanoshells148
5.7StudiesofCrystalDefectsandInterfaces150
5.8TheStructureandCompositionofSurfaces152
5.8.1Ultra\|HighVacuumInstruments152
5.8.2ReflectionElectronMicroscopy152
5.8.3SurfaceChannelingEffects154
5.8.4MEEDandMEEM154
5.9AmorphousMaterials154
5.9.1ThinQuasi\|AmorphousFilms154
5.9.2ThickAmorphousFilms155
5.10STEMHolography156
5.10.1Gabor’sIn\|LineHolography156
5.10.2Off\|AxisHolography157
5.11Ultra\|High\|ResolutionSTEM159
5.11.1AtomicFocusers159
5.11.2AberrationCorrection159
5.11.3CombiningNanodiffractionandImaging161
5.12Conclusions162
References163
6In\|situElectronMicroscopyforNanomeasurements169
6.1Introduction169
6.2ThermalInducedSurfaceDynamicProcesses
ofNanocrystals169
6.3MeasuringDynamicBendingModulusby
ElectricFieldInducedMechanicalResonance171
6.3.1Young’sModulusMeasuredbyQuantifying
ThermalVibrationAmplitude171
6.3.2BendingModulusbyElectricFieldInduced
MechanicalResonance173
6.4Young’sModulusofCompositeNanowires181
6.5BendingModulusofOxideNanobelts184
6.5.1Nanobelts184
6.5.2Dual\|modeResonanceofNanobelts185
6.5.3BendingModulusofNanobelt187
6.6NanobeltsasNanocantilevers188
6.7In\|situFieldEmissionfromNanotube189
6.8WorkFunctionattheTipsofNanotubesandNanobelts190
6.9MappingtheElectrostaticPotentialattheNanotubeTips193
6.10FieldEmissionInducedStructuralDamage195
6.11NanothermometerandNanobearing197
6.12In\|situTransportMeasurementofNanotubes197
6.12.1BallisticQuantumConductanceatRoom
Temperature197
6.12.2QuantumConductanceandSurface
Contamination199
6.12.3TopLayerTransportinMWNT203
6.13Summary204
References205
7EnvironmentalTransmissionElectronMicroscopy
inNanotechnology209
7.1Introduction209
7.2HistoryofETEM211
7.2.1EarlyDevelopments211
7.2.2LaterDevelopmentsandCurrentStatus212
7.3DataCollection215
7.3.1Real\|TimeImagingSystems215
7.3.2SpectroscopyandChemicalAnalysis217
7.4ExperimentalDesignStrategies218
7.5ApplicationstoNanomaterials220
7.5.1TransformationMechanismsinNanostructures
duetoGas\|solidReactions220
7.5.2ControlledSynthesisofNanostructures229
7.5.3Kinetics233
7.6Conclusions239
References240
8ElectronNanocrystallography243
8.1Introduction243
8.2ElectronDiffractionModesandGeometry244
8.2.1SelectedAreaElectronDiffraction245
8.2.2Nano\|AreaElectronDiffraction246
8.2.3ConvergentBeamElectronDiffraction247
8.3TheoryofElectronDiffraction249
8.3.1KinematicElectronDiffraction
andElectronAtomicScattering249
8.3.2KinematicalElectronDiffractionfromanAssembly
ofAtoms251
8.3.3GeometryofElectronDiffraction
fromPerfectCrystals254
8.3.4TheGeometryofaCBEDPattern257
8.3.5ElectronDynamicTheory—
theBlochWaveMethod257
8.4ExperimentalAnalysis260
8.4.1ExperimentalDiffractionPatternRecording260
8.4.2ThePhaseProblemandInversion262
8.4.3TheRefinementTechnique263
8.4.4ElectronDiffractionOversamplingandPhaseRetrieval
forNanomaterials267
8.5ApplicationstoNanostructureCharacterization268
8.5.1StructureDeterminationofIndividual
Single\|WallCarbonNanotubes268
8.5.2TheStructureofSupportedSmallNanoclusters
andEpitaxy271
8.5.3CrystalChargeDensity273
8.6ConclusionsandFuturePerspectives275
References275
9TomographyUsingtheTransmission
ElectronMicroscope279
9.1Introduction279
9.2Tomography281
9.2.1AHistoryofTomography281
9.2.2TheRadonTransform282
9.2.3TheCentralSliceTheoremandFourier
SpaceReconstruction283
9.2.4RealSpaceReconstructionUsingBackprojection284
9.3TomographyintheElectronMicroscope287
9.3.1Acquisition287
9.3.2Alignment288
9.3.3AnisotropicResolution289
9.3.4TheProjectionRequirement292
9.4STEMHAADFTomography293
9.5EFTEMTomography299
9.6Conclusions302
References303
10Off\|AxisElectronHolography307
10.1ElectronHolographyandNanotechnology307
10.2DescriptionofOff\|AxisElectronHolography308
10.2.1ExperimentalSet\|up308
10.2.2BasicImagingTheory
andHologramReconstruction310
10.2.3PhaseShiftsandMeanInnerPotential312
10.2.4Quantification314
10.2.5PracticalConsiderations315
10.3NanoscaleElectrostaticFields316
10.3.1DopantProfiles317
10.3.2PiezoelectricFields317
10.3.3ChargedDefects318
10.3.4Field\|EmittingCarbonNanotubes320
10.3.5ThicknessandSampleMorphology321
10.4NanoscaleMagneticFields321
10.4.1PatternedNanostructures322
10.4.2NanoparticleChains325
10.5FuturePerspectives327
References328
11Sub\|nmSpatiallyResolvedEELS(ElectronEnergy\|LossSpectroscopy):
Methods,TheoryandApplications331
11.1Introduction:EELSandNanotechnology331
11.2UnderstandingtheInformationContained
inanEELSSpectrum332
11.2.1DefinitionofanEELSSpectrumandoftheBasic
InformationWhichItContains332
11.2.2BasicToolsDevelopedforInterpretingand
UsingCore\|LossSignals336
11.3SpatiallyResolvedEELS341
11.3.1The3DDataCube341
11.3.2InstrumentationRequiredforRecording
the3DDataCube,DefinitionandEstimate
oftheSpatialandEnergyResolutions343
11.4ElementalMappingofIndividualNanoparticles
UsingCore\|lossSignals348
11.4.1DataProcessingRoutines:BackgroundSubtraction,
MultipleLeastSquareFitting348
11.4.2AFewExamplesofElementalMappingwith
EELSCoreEdges350
11.4.3Sensitivity,LimitsofDetection
inEELSElementalMapping352
11.5MappingBondingStatesandElectronicStructureswithELNES
Features352
11.5.1AFewSelectedExamples353
11.5.2FromFingerprintTechniquestoInterpretationsRequiring
ExtendedTheoreticalCalculations355
11.6Conclusions357
References357
12ImagingMagneticStructuresUsingTEM361
12.1Introduction361
12.2LorentzMicroscopy362
12.2.1Introduction362
12.2.2Magnetic\|ShieldLens362
12.2.3DeflectionAngleDuetoLorentzForce363
12.2.4FresnelMode364
12.2.5FoucaultMode371
12.2.6LorentzPhaseMicroscopy372
12.3ElectronHolography376
12.3.1Introduction376
12.3.2ObservationofSingleMagnetic
DomainParticles377
12.3.3Real\|timeObservation377
12.3.4High\|precisionObservation381
12.4Summary392
References392
Index395
