《Reliability Wearout Mechanisms in Advanced CMOS Technologies》是2009年8月出版的圖書，作者是Strong, Alvin W、Wu, Ernest Y、Vollertsen, Rolf-peter、Sune, Jordi、La Rosa, Guiseppe。
基本介紹
- 中文名：Reliability Wearout Mechanisms in Advanced CMOS Technologies
- 作者：Strong, Alvin W、Wu, Ernest Y、Vollertsen, Rolf-peter、Sune, Jordi、La Rosa, Guiseppe
- 出版時間：2009年8月
- ISBN：9780471731726
內容簡介
A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: Introduction to Reliability Gate Dielectric Reliability Negative Bias Temperature Instability Hot Carrier Injection Electromigration Reliability Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.
